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BS EN IEC 63244-1. Semiconductor devices. Semiconductor devices for wireless power transfer and charging - Part 1. General requirements and specifications Ingestion-build-177197 ranges of approval

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ranges of approval

inspection and testing of PCPV for nuclear reactors

BS EN 1883 specifies a method for obtaining a representative laboratory bulk sample of a lot of feathers and down and feather and down in a manufactured product or of a manufactured product

makes the evaluation of the perfluorinated and poly-fluorinated substances with respect to the mass

20) boron oxide (total boron calculated as B2O3)

BS EN IEC 63244-1. Semiconductor devices. Semiconductor devices for wireless power transfer and charging - Part 1. General requirements and specifications Ingestion-build-177197 ranges of approval

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