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Semiconductor devices. Mechanical and climatic test methods - Latch-up test Ingestion-build-61878 What is BS EN 502031 Scope and object This part of IEC 60749 covers the I test and the overvoltage latch up testing of integrated circuits. This test is classified as destructive. The purpose of this test is to establish a method for determining integrated circuit (IC) latch up characteristics and to define latch up failure criteria. Latch up characteristics are used in determining product reliability and minimizing "no trouble found" (NTF) and "electrical overstress"