Thermal Oxide Wafer: 300 nm SiO2 Layer on Si (100), 2" dia x 0.50 mm t, N type ,As-doped, 1 side polished, R:0.001-0.005 ohm.cm - Fm300SOonSIAsa50D05C Aluminum Oxide Substrates Al2O3 Resistivities (ohm-cm): 0

Resistivities (ohm-cm):                       0

In order to make a neat and tidy cell with the smooth edge just like the commercial pouch batteries

The crimper is driven by compressed inert gas or air for various types of coin cells such as CR2016

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PP Battery Separator Roll by Dry Method (800 m L × 60 mm W × 25 um T) can be used as an excellent Li ion battery separator

Thermal Oxide Wafer: 300 nm SiO2 Layer on Si (100), 2" dia x 0.50 mm t, N type ,As-doped, 1 side polished, R:0.001-0.005 ohm.cm - Fm300SOonSIAsa50D05C Aluminum Oxide Substrates Al2O3 Resistivities (ohm-cm): 0Thermal oxide Layer Research Grade, about 80 % useful area SiO2 layer on 2" Silicon wafer Oxide layer thickness: 300 nm ( 3000A) + 10% Refractive index: 1. 455 Silicon Wafer Specifications: Conductive type: N type As doped Resistivity: 0. 001 0. 005 ohm cm Size: 50. 8 diameter + 0. 5 mm x 0. 50 + 0. 025 mm Orientation: (100) + 1o Polish: one side polished Surface roughness, Ra: < 5A (RMS) Related Products Thin Films A Z Crystal wafer A Z Plasma