Semiconductor devices. Mechanical and climatic test methods - Mechanical shock Ingestion-build-205840 blank test

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Semiconductor devices. Mechanical and climatic test methods - Mechanical shock Ingestion-build-205840 blank test1 Scope This part of IEC 60749 describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive