Ge Substrate: (100) 5x5 x 0.5 mm , 1SP, N type Sb doped,R:0.1-0.5 Ohm.cm Si 1300 ~ 1600

1300 ~ 1600

Brand new laptop with MS Window 10 latest version testing software is installed and calibrated for immediate use (Up to 20 sets of analyzers can be simultaneously controlled by one PC)

Detailed demension drawing Max

mm ( open frame )

High-strength glass as the front door for easy observation

Ge Substrate: (100) 5x5 x 0.5 mm , 1SP, N type Sb doped,R:0.1-0.5 Ohm.cm Si 1300 ~ 1600Ge Wafer Specification Growing Method: CZ Wafer Size: 5x5 x0. 5 mm Surface Polishing: one side epi polished Orientation: (100) Surface roughness: RMS or Ra:~ 10 A(By AFM) Doping: Sb doped Conductor type: N type Resistivity: 0. 1 0. 5 Ohm. cm (If you would like to measure the resistivity accurately, please order our Portable 4 Probe Resistivity Testing Instrument.) Package: under 1000 class clean room in wafer container Related Product Other Crystal