Semiconductor devices. Mechanical and climatic test methods - Neutron irradiation Ingestion-build-93833 Elementary street unit records

Elementary street unit records

Together with BS EN 81-20:2014

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The electrical characteristics of the supply

BS ISO/IEC 19784-1:2006+A3:2010 Information technology

Semiconductor devices. Mechanical and climatic test methods - Neutron irradiation Ingestion-build-93833 Elementary street unit recordsWhat is BS EN IEC 6074917 about? BS EN IEC 6074917 is the 17th part of an international standard that covers the attributes of semiconductor devices. This specifies the neutron irradiation test method for determining the degradation parameters of critical semiconductor devices. BS EN IEC 6074917 specifies the neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non ionizing energy loss (NIEL) degradation.