Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level has-hardcopy pores that have been covered

pores that have been covered over by a very thin layer

• equipment in close proximity to receiving antennas

Why should you use ISO 17705 – Testing thermal insulation for uppers

BS EN 2311 specifies the required characteristics

are tested in a tensile testing machine after air conditioning or soaking with water

Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level has-hardcopy pores that have been covered1 Scope This part of IEC 60749 establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto electronic devices, hybrid integrated circuits (HICs), and