Semiconductor devices - Mechanical and climatic test methods - Guidelines for IC reliability qualification plans Ingestion-build-105964 Electronica and telecommunication industry

Electronica and telecommunication industry

Updates have been made to bring the document in line with current-generation technologies

This part of IEC 61935 specifies additional reference measurement procedures for measurement of resistance unbalance with field test instrumentation

Provide recognition of compliance policies and procedures

Why should you use BS 5821-3 - Airborne sound insulation of façade elements and façades

Semiconductor devices - Mechanical and climatic test methods - Guidelines for IC reliability qualification plans Ingestion-build-105964 Electronica and telecommunication industry1 Scope This part of IEC 60749 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military and space related applications. NOTE 1 The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified. NOTE