E12500 - SEMI E125 - Specification for Equipment Self Description (EqSD) StdPbc-1211 Originally published in 1997

Originally published in 1997

SEMI MF43 — Test Method for Resistivity of Semiconductor Materials

SEMI MF391 — Test Method for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage

SEMI E114-0302 (first published)

This edition was approved for publication by the global Audits and Reviews Subcommittee on July 1

E12500 - SEMI E125 - Specification for Equipment Self Description (EqSD) StdPbc-1211 Originally published in 1997* This Standard has the option to purchase the Current document with a redline document (Current + Redline). The redline document is included with the Current document as a comparison tool to help identify changes that have been made between the Current version and the previous version (Superseded). If differences should exist between the redline document and the Current document, the Current version is the official and authoritative version. 1