E18300 - SEMI E183 - Specification for Rich Interactive Test Database (RITdb) Revision:SEMI E183-0123 - Current the requirements are presented as

the requirements are presented as guides

SEMI MF42-02 (first SEMI publication)

This Document specifies the external features and dimensions of the 450 mm carrier

1  Introduction

再利用またはリサイクルの可能性の特定

E18300 - SEMI E183 - Specification for Rich Interactive Test Database (RITdb) Revision:SEMI E183-0123 - Current the requirements are presented asThis Specification describes a data and event sharing and streaming methodology for semiconductor test and related operations. The scheme fully supports legacy equipment and allows equipment vendors the flexibility to provide additional data items via extensions. Real time, historical, and widely distributed data are fully supported. Provenance of all data is supported via customizable metadata along with cryptographic hashing and signing.