G06800 - SEMI G68 - 空気環境における半導体パッケージのジャンクション部とケース間の熱抵抗測定の試験方法 StdPbc-0217 SEMI MF1528-94 (Reapproved 1999) (first

SEMI MF1528-94 (Reapproved 1999) (first SEMI publication)

lower space requirement

Report basic equipment state changes to a host computer

Test methods have been shown to give statistically valid results

Compared with damp heat (DH) tests

G06800 - SEMI G68 - 空気環境における半導体パッケージのジャンクション部とケース間の熱抵抗測定の試験方法 StdPbc-0217 SEMI MF1528-94 (Reapproved 1999) (firstglobal Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org1996200411 : Referenced SEMI Standards SEMI G30 Test Method for Junction to Case Thermal Resistance Measurements of Ceramic Packages SEMI G32 Guideline for Unencapsulated Thermal Test Chip SEMI G38 Test Method for Still and Forced Air Junction to Ambient Thermal Resistance Measurements of Integrated Circuit Packages SEMI