E09000 - SEMI E90 - 기판 추적 사양 Revision:SEMI E90-0312 - Superseded this Test Method only applies

this Test Method only applies if the laser is Class 1 or Class 2

SEMI T7-0997E2 (editorial revision)

SEMI E84-1101 (technical revision)

4  This Standard is suitable for both side-view and top-view surface mount device (SMD) LEDs

The specification format in this Standard provides a comprehensive listing of such properties and available associated test methods (see Appendix 1)

E09000 - SEMI E90 - 기판 추적 사양 Revision:SEMI E90-0312 - Superseded this Test Method only appliesGlobal Information & Control Technical Committee , 2011 12 24Audits and Reviews Subcommittee . 1999 , 2011 11 . www. semiviews. org www. semi. org 2012 3 . (substrate ) . (substrates) . (substrate) , (substrate) . (substrate) . . , (substrate) , (substrate) , (batch) (batch) . (substrate) , . Subordinate Document: SEMI E90. 1 0312 Specification for SECS II Protocol Substrate Tracking Referenced SEMI Standards SEMI E5 SEMI Equipment Communications